Journal
2014 IEEE CONFERENCE ON ELECTRICAL INSULATION AND DIELECTRIC PHENOMENA (CEIDP)
Volume -, Issue -, Pages 816-819Publisher
IEEE
Keywords
-
Categories
Ask authors/readers for more resources
In this work epoxy based, mineral filled, thin layers are studied. Results of broadband dielectric spectroscopy ranging from -150 degrees C to 100 degrees C and 0.01 Hz to 1 MHz are presented. Fourier transform infrared spectroscopy, scanning electron microscopy, energy-dispersive X-ray spectroscopy and also X-ray diffraction were used for chemical characterization of the materials. On the base of the results, proper material candidates can be selected for a desired application.
Authors
I am an author on this paper
Click your name to claim this paper and add it to your profile.
Reviews
Recommended
No Data Available
Share Paper
