4.7 Article

Diagnosis and Prognosis of Degradation Process via Hidden Semi-Markov Model

Journal

IEEE-ASME TRANSACTIONS ON MECHATRONICS
Volume 23, Issue 3, Pages 1456-1466

Publisher

IEEE-INST ELECTRICAL ELECTRONICS ENGINEERS INC
DOI: 10.1109/TMECH.2018.2823320

Keywords

Degradation process; forward-backward algorithm; health monitoring; Hidden semi-Markov; remaining useful life (RUL)

Funding

  1. CAS 100 Talents Program, Chinese Academy of Sciences
  2. National Natural Science Foundation of China [51475443]

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The intelligent estimation of degradation state and the prediction of remaining useful life (RUL) are important for the maintenance of industrial equipment. In this study, the degradation process of equipment is modeled as an improved hidden semi-Markov model (HSMM), in which the dependence of durations of adjacent degradation states is described and modeled in the HSMM. To avoid underflow problem in computing the forward and backward variables, a modified forward-backward algorithm is proposed in the HSMM. Based on the improved algorithm, online estimation of degradation state and the distribution of RUL can be obtained. Case studies on tool wearing diagnosis and prognosis have verified the effectiveness of this model.

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