A Double-Node-Upset Self-Recoverable Latch Design for High Performance and Low Power Application

This brief presents a double-node upset (DNU) self-recoverable latch design for high performance and low power application. The latch is mainly constructed from eight mutually feeding hack C-elements and any node pair of the latch is DNU self-recoverable. Using a high speed transmission path and a clock gating technique, the latch has high performance and low power dissipation. Simulation results demonstrate the DNU self-recoverability of the latch and also show that the delay-power-area product of the latch is improved approximately by 81.80% on average, compared with the latest DNU self-recoverable latch designs.