Two-Dimensional Edge Detection by Guided Mode Resonant Metasurface

In this letter, a new approach to perform edge detection is presented using an all-dielectric complimentary metal-oxide-semiconductor-compatible metasurface. Our design is based on the guided-mode resonance, which provides a high quality factor resonance to make the edge detection experimentally realizable. The proposed structure is easy to fabricate, and it can be exploited for detection of edges in two dimensions due to its symmetry. In addition, a tradeoff between gain and the resolution of edge detection is discussed, which can be adjusted using appropriate design parameters. The proposed edge detector potentially can be used in ultrafast analog computing and image processing.