3.8 Proceedings Paper

Performance limiting processes in room temperature Thallium Bromide radiation detectors

Publisher

SPIE-INT SOC OPTICAL ENGINEERING
DOI: 10.1117/12.2186861

Keywords

Polarization; ionic conduction; residual stress; Thallium Bromide; Room-Temperature Semiconductor Detector; Metal Bromide formation; hole mobility; Gamma spectroscopy

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Thallium Bromide (TlBr) is a promising room-temperature radiation detector candidate with excellent charge transport properties. However, several critical issues are needed to be addressed before deployment of this material for long-term field applications. In this paper, the relevance and, scientific and technological progress made towards solving these challenges for TlBr have been discussed. The possible research pathways to mitigate the concerns related to this material have been analyzed and clearly established. Findings from novel experiments performed at CapeSym have revealed that the most significant factors for achieving long-term performance stability for TlBr devices involve physical and chemical conditions of the surface, residual stress, and choice of metal contacts. Palladium electrodes on TlBr devices resulted in a 20-fold improvement in the device lifetime when compared to its Br-etched Pt counterpart. Electron and hole contributions towards the spectroscopic response of the TlBr detector significantly depend on the interaction position of the incoming radiation and was clearly observed in this study. TlBr device fabrication techniques need significant improvement in order to attain reliable, repeatable, and stable, long-term performance.

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