Journal
CHEMICAL COMMUNICATIONS
Volume 54, Issue 32, Pages 3997-4000Publisher
ROYAL SOC CHEMISTRY
DOI: 10.1039/c7cc09708e
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Funding
- National Natural Science Foundation of China [11672341, 111572002, 51302011]
- 973 Project [2015CB932500]
- Foundation for Innovative Research Groups of the National Natural Science Foundation of China [11521202]
- National Materials Genome Project [2016YFB0700600]
- Beijing Natural Science Foundation [16L00001]
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An in situ optical system was used to observe the failure processes of two-dimensional silicon film anodes, suggesting a new debonding mode based on crack crushing. The stress evolution upon lithiation was quantitatively analyzed via fully coupled finite element simulations, confirming the crack crushing induced failure mechanisms in 2D silicon anodes.
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