Journal
CERAMICS INTERNATIONAL
Volume 44, Issue 8, Pages 8870-8876Publisher
ELSEVIER SCI LTD
DOI: 10.1016/j.ceramint.2018.02.072
Keywords
Failure analysis; Fatigue; Si3N4; Insulators
Categories
Funding
- Council for Science, Technology and Innovation (CSTI), the Cross-ministerial Strategic Innovation Promotion Program (SIP), Next-generation power electronics/Consistent RD of next-generation SiC power electronics (New Energy and Industrial Technology Dev
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The effect of temperature cycling from -40 to 250 degrees C on active metal brazing (AMB) substrates for power modules was investigated using newly developed silicon nitride ceramics with both high thermal conductivity of 140 W m(-1) K-1 and superior fracture toughness of 10.5 MPa m(1/2). Other types of AMB substrates made of AlN or Si3N4 were also tested for comparison. Both visual inspection and acoustic scanning microscopy (ASM) observation of the new Si3N4-AMB substrates after 1000 cycles revealed almost no cracks. In contrast, the Si3N4-AMB substrates with lower fracture toughness experienced crack initiation beneath the comer of the copper plate. The degradation in the bending strength after 1000 cycles was negligible for the new Si3N4-AMB substrates, whereas the bending strength of the other substrates decreased gradually with each thermal cycle. The endurance of the AMB substrates to thermal fatigue could be improved significantly by employing the new tough Si3N4 with high thermal conductivity.
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