Journal
CERAMICS INTERNATIONAL
Volume 44, Issue 6, Pages 6699-6704Publisher
ELSEVIER SCI LTD
DOI: 10.1016/j.ceramint.2018.01.084
Keywords
Sintering; Electron microscopy; Dielectric properties; Raman spectroscopy
Categories
Funding
- Board of Research in Nuclear Sciences, Mumbai [34/15/01/2014-BRNS/0906]
- Council of Scientific and Industrial Research (CSIR), India
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Na5Y(MoO4)(4) and Na5Yb(MoO4)(4) ceramics are prepared by solid state ceramic route and structural characterization has been done using powder X-ray diffraction and Laser Raman spectroscopy techniques. The presence of MoO42- units in the crystal structure is confirmed from Raman spectra. The scanning electron micrographs of the sintered ceramic samples show dense microstructure. Na5Y(MoO4)(4) ceramic exhibited a maximum sintered density of 3.6 g/cm(3) at 600 degrees C with a dielectric constant of 7.8, quality factor (Q x f) of 56,800 GHz, and temperature coefficient of resonant frequency (tau(f)) of -83 ppm/degrees C, whereas Na5Yb(MoO4)(4) ceramic showed a maximum sintered density of 3.9 g/cm(3) at 570 degrees C with a dielectric constant of 6.9, quality factor (Q x f) of 43,400 GHz, and temperature coefficient of resonant frequency (T-f) of -68 ppm/degrees C. Powder X-ray diffraction and energy dispersive X-ray spectroscopic analyses of the co-fired samples confirm good chemical compatibility with aluminium electrode for Na5Yb(MoO4)(4) ceramic and hence is a suitable candidate material for ULTCC applications.
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