3.8 Proceedings Paper

A High Temperature Comparator in CMOS SiC

Publisher

IEEE

Keywords

comparator; silicon carbide; high temperature electronics; wide bandgap ICs

Funding

  1. Div Of Industrial Innovation & Partnersh
  2. Directorate For Engineering [1465243] Funding Source: National Science Foundation

Ask authors/readers for more resources

This paper demonstrates the first reported high temperature voltage comparator in CMOS silicon carbide. The comparator was designed in a 1.2 mu m CMOS SiC process and has been tested for a voltage supply of 12 V to 15 V. The rail to rail voltage comparator has been tested up to 450 degrees C with rise and fall times of 31 ns and 22 ns respectively, and positive and negative propagation delays of 108 ns and 107 ns respectively.

Authors

I am an author on this paper
Click your name to claim this paper and add it to your profile.

Reviews

Primary Rating

3.8
Not enough ratings

Secondary Ratings

Novelty
-
Significance
-
Scientific rigor
-
Rate this paper

Recommended

No Data Available
No Data Available