Journal
PHYSICAL REVIEW B
Volume 93, Issue 24, Pages -Publisher
AMER PHYSICAL SOC
DOI: 10.1103/PhysRevB.93.245408
Keywords
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Funding
- Japan Society for the Promotion of Science (JSPS) [26820122]
- JSPS [23000008]
- Russian Foundation for Basic Research
- Research Institute for Information Technology Center, Nagoya University, through the HPCI System Research Project [hp140086]
- Grants-in-Aid for Scientific Research [16K14243, 16H06361, 23000008, 26820122] Funding Source: KAKEN
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We study the instability of plasmons in a dual-grating-gate graphene field-effect transistor induced by dc current injection using self-consistent simulations with the Boltzmann equation. With only acoustic-phononlimited electron scattering, it is demonstrated that a total growth rate of the plasmon instability, with a terahertz/midinfrared range of the frequency, can exceed 4x10(12) s(-1) at room temperature, which is an order of magnitude larger than in two-dimensional electron gases based on the usual semiconductors. By comparing the simulation results with existing theory, it is revealed that the giant total growth rate originates from a simultaneous occurrence of the so-called Dyakonov-Shur and Ryzhii-Satou-Shur instabilities.
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