4.6 Article

Oxygen vacancies: The origin of n-type conductivity in ZnO

Journal

PHYSICAL REVIEW B
Volume 93, Issue 23, Pages -

Publisher

AMER PHYSICAL SOC
DOI: 10.1103/PhysRevB.93.235305

Keywords

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Funding

  1. Ministry of Science and Technology of China [2011CB302002, 2011CB302006]
  2. National Science Foundation of China [11174348, 51272280, 11274366, 61204067, 61306011, 11321091]
  3. Research Council of Norway [221668]

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Oxygen vacancy (V-O) is a common native point defect that plays crucial roles in determining the physical and chemical properties of metal oxides such as ZnO. However, fundamental understanding of V-O is still very sparse. Specifically, whether V-O is mainly responsible for the n-type conductivity in ZnO has been still unsettled in the past 50 years. Here, we report on a study of oxygen self-diffusion by conceiving and growing oxygen-isotope ZnO heterostructures with delicately controlled chemical potential and Fermi level. The diffusion process is found to be predominantly mediated by V-O. We further demonstrate that, in contrast to the general belief of their neutral attribute, the oxygen vacancies in ZnO are actually +2 charged and thus responsible for the unintentional n-type conductivity as well as the nonstoichiometry of ZnO. The methodology can be extended to study oxygen-related point defects and their energetics in other technologically important oxide materials.

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