Journal
APPLIED OPTICS
Volume 55, Issue 20, Pages 5353-5357Publisher
OPTICAL SOC AMER
DOI: 10.1364/AO.55.005353
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Radio frequency magnetron sputtering has been used here to find the parameters at which to deposit Ta2O5 optical thin films with negligible absorption in the visible spectrum. The design of experiment methodology was employed to minimize the number of experiments needed to find the optimal results. Two independent approaches were used to determine the index of refraction n and k values. (C) 2016 Optical Society of America
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