Journal
APPLIED OPTICS
Volume 55, Issue 20, Pages 5372-5378Publisher
OPTICAL SOC AMER
DOI: 10.1364/AO.55.005372
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Funding
- National Natural Science Foundation of China (NSFC) [61575075, 61008031]
- Fundamental Research Funds for the Central Universities [HIT.NSRIF.2014020]
- Postdoctoral Science-Research Development Foundation of Heilongjiang Province [LBH-Q13078]
- Natural Science Foundation of Heilongjiang Province [F2016014]
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The validity of real and complex equivalent refractive index models (ERIMs) is verified for a shielding effectiveness evaluation of high-transmittance double-layer metallic meshes. Theoretical and experimental studies show that the real ERIM is invalid for thin substrates and inaccurate for thick substrates for double-layer meshes, although it has long been used successfully for single-layer meshes. However, the complex ERIM shows more reasonable results not only for double-layer but also for single-layer meshes, and the evaluation accuracy is further improved by modifying the equivalent reactance coefficient using least-squares fitting. Therefore, the modified complex ERIM is applicable in most conditions. (C) 2016 Optical Society of America
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