4.8 Article

High-Mobility Helical Tellurium Field-Effect Transistors Enabled by Transfer-Free, Low-Temperature Direct Growth

Journal

ADVANCED MATERIALS
Volume 30, Issue 36, Pages -

Publisher

WILEY-V C H VERLAG GMBH
DOI: 10.1002/adma.201803109

Keywords

high-mobility field-effect transistors; low-temperature growth; MBE growth; tellurium; transfer-free device fabrication

Funding

  1. NEWLIMITS, a center in nCORE, a Semiconductor Research Corporation (SRC) program - NIST [70NANB17H041]
  2. NSF [1407765]

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The transfer-free direct growth of high-performance materials and devices can enable transformative new technologies. Here, room-temperature field-effect hole mobilities as high as 707 cm(2) V-1 s(-1) are reported, achieved using transfer-free, low-temperature (<= 120 degrees C) direct growth of helical tellurium (Te) nanostructure devices on SiO2/Si. The Te nanostructures exhibit significantly higher device performance than other low-temperature grown semiconductors, and it is demonstrated that through careful control of the growth process, high-performance Te can be grown on other technologically relevant substrates including flexible plastics like polyethylene terephthalate and graphene in addition to amorphous oxides like SiO2/Si and HfO2. The morphology of the Te films can be tailored by the growth temperature, and different carrier scattering mechanisms are identified for films with different morphologies. The transfer-free direct growth of high-mobility Te devices can enable major technological breakthroughs, as the low-temperature growth and fabrication is compatible with the severe thermal budget constraints of emerging applications. For example, vertical integration of novel devices atop a silicon complementary metal oxide semiconductor platform (thermal budget <450 degrees C) has been theoretically shown to provide a 10x systems level performance improvement, while flexible and wearable electronics (thermal budget <200 degrees C) can revolutionize defense and medical applications.

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