Journal
ADVANCED MATERIALS
Volume 30, Issue 31, Pages -Publisher
WILEY-V C H VERLAG GMBH
DOI: 10.1002/adma.201801773
Keywords
charge separation and transfer; doping; oxygen defects; plasma; protection layers
Categories
Funding
- National Natural Science Foundation of China [51402100, 21573066]
- Provincial Natural Science Foundation of Hunan [2016JJ1006, 2016TP1009]
- Shanghai Sailing Program [17YF1429800]
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Silicon (Si) requires a protection layer to maintain stable and long-time photoanodic reaction. However, poor charge separation and transfer are key constraint factors in protection layer/Si photoanodes that reduce their water-splitting efficiency. Here, a simultaneous enhancement of charge separation and transfer in Nb-doped NiOx/Ni/black-Si photoanodes induced by plasma treatment is reported. The optimized photoanodes yield the highest charge-separation efficiency (eta(sep)) of approximate to 81% at 1.23 V versus reversible hydrogen electrode, corresponding to the photocurrent density of approximate to 29.1 mA cm(-2). On the basis of detailed characterizations, the concentration and species of oxygen defects in the NiOx-based layer are adjusted by synergistic effect of Nb doping and plasma treatment, which are the dominating factors for forming suitable band structure and providing a favorable hole-migration channel. This work elucidates the important role of oxygen defects on charge separation and transfer in the protection layer/Si-based photoelectrochemical systems and is encouraging for application of this synergistic strategy to other candidate photoanodes.
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