Journal
ADVANCED FUNCTIONAL MATERIALS
Volume 28, Issue 33, Pages -Publisher
WILEY-V C H VERLAG GMBH
DOI: 10.1002/adfm.201802084
Keywords
2D materials; molecular beam epitaxy; orthorhombic MoTe2; transmission electron microscopy; Weyl semimetal
Categories
Funding
- LANEF Chair of Excellence program of U. Grenoble Alpes
- CEA
- Greek State Scholarships Foundation (IKY) Program for the strengthening of postdoctoral research
- French state funds [ANR-10-LABX-51-01]
- Equipex [ANR-11-EQPX-0010]
Ask authors/readers for more resources
The direct observation at room temperature (RT) of the noncentrosymmetric orthorhombic topological Weyl semimetal phase in epitaxial thin films of MoTe2 grown on InAs(111)/Si(111) substrates by molecular beam epitaxy (MBE) is reported. The orthorhombic phase is typically found at lower temperatures but its observation at RT in this work is attributed to the enlarged lattice parameters, influenced by the substrate, which stabilize an interlayer antibonding state compatible with the orthorhombic stacking. First-principles calculations predict eight type II Weyl nodes which are located below (but near) the Fermi energy making them accessible to charge transport and creating the prospect for practical applications exploiting the nontrivial topological properties. The orthorhombic phase coexists with an unconventional triclinic layer stacking which is different than the monoclinic or orthorhombic structures but it is centrosymmetric and topologically trivial.
Authors
I am an author on this paper
Click your name to claim this paper and add it to your profile.
Reviews
Recommended
No Data Available