Journal
ACS APPLIED MATERIALS & INTERFACES
Volume 10, Issue 3, Pages 2230-2235Publisher
AMER CHEMICAL SOC
DOI: 10.1021/acsami.7b17224
Keywords
oxide; nucleation; transmission electron microscopy; aluminum; high resolution transmission electron microscopy; environmental transmission electron microscopy; electron energy loss spectroscopy
Funding
- Engineering and Physical Sciences (EPSRC) U.K [EP/G035954/1, EP/K016946/1]
- Defence Threat Reduction Agency [HDTRA1-12-1-0013]
- U.S. DOE Office of Science Facility, at Brookhaven National Laboratory [DE-SC0012704]
- European Research Council (ERC) under European Union's Horizon research and innovation programme [ERC-2016-STG-EvoluTEM-715502]
- EPSRC [EP/K016946/1, EP/G035954/1, EP/P025021/1, EP/K005014/1] Funding Source: UKRI
- Engineering and Physical Sciences Research Council [EP/R00661X/1, EP/P025021/1, EP/K005014/1, EP/G035954/1, EP/S019367/1, EP/K016946/1] Funding Source: researchfish
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The surface oxidation of aluminum is still poorly understood despite its vital role as an insulator in electronics, in aluminum-air batteries, and in protecting the metal against corrosion. Here we use atomic resolution imaging in an environmental transmission electron microscope (TEM) to investigate the mechanism of aluminum oxide formation. Harnessing electron beam sputtering we prepare a pristine, oxide-free metal surface in the TEM. This allows us to study, as a function of crystallographic orientation and oxygen gas pressure, the full oxide growth regime from the first oxide nucleation to a complete saturated, few-nanometers-thick surface film.
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