Journal
RESULTS IN PHYSICS
Volume 7, Issue -, Pages 651-655Publisher
ELSEVIER SCIENCE BV
DOI: 10.1016/j.rinp.2016.12.029
Keywords
Multilayer films; Semiconductor; ZnO; XRD; SEM; Optoelectronic properties
Funding
- King Saud University, Deanship of Scientific Research, College of Science Research Center, Saudi Arabia
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In this work, zinc oxide (ZnO) multilayer thin films are deposited on glass substrate using sol-gel spin coating technique and the effect of these multilayer films on optical, electrical and structural properties are investigated. It is observed that these multilayer films have great impact on the properties of ZnO. Xray Diffraction (XRD) confirms that ZnO has hexagonal wurtzite structure. Scanning Electron Microscopy (SEM) showed the crack-free films which have uniformly distributed grains structures. Both micro and nano particles of ZnO are present on thin films. Four point probe measured the electrical properties showed the decreasing trend between the average resistivity and the number of layers. The optical absorption spectra measured using UV-Vis. showed the average transmittance in the visible region of all films is 80% which is good for solar spectra. The performance of the multilayer as transparent conducting material is better than the single layer of ZnO. This work provides a low cost, environment friendly and well abandoned material for solar cells applications. (C) 2017 The Authors. Published by Elsevier B.V. This is an open access article under the CC BY-NC-ND license.
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