3.8 Proceedings Paper

The Effect of the Annealing on the Properties of ZnO/Cu/ZnO Multilayer Structures

Publisher

ELSEVIER SCIENCE BV
DOI: 10.1016/j.proche.2016.03.011

Keywords

RF sputtering; multilayer; Optical and Electrical properties

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Study of ZnO / Cu / ZnO multilayer film stack using Cu film as a sandwich layer, in order to improve the overall performance of the transparent conductive film, structural, electrical and optical properties. ZnO / Cu / ZnO multilayer films prepared at room temperature by a DC and RF magnetron sputtering technique. The results showed that ZnO / Cu / ZnO multilayer film has good crystalline properties. With an increasing Cu layer thickness, a visible light transmittance of the multilayer film is reduced, while the electrical performance improved significantly. In the Cu layer thickness of 20 nm, ZnO / Cu / ZnO multilayer film optoelectronic integrated for optimal performance (C) 2016 The Authors. Published by Elsevier B.V.

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