Journal
IEEE JOURNAL OF EMERGING AND SELECTED TOPICS IN POWER ELECTRONICS
Volume 5, Issue 3, Pages 1356-1376Publisher
IEEE-INST ELECTRICAL ELECTRONICS ENGINEERS INC
DOI: 10.1109/JESTPE.2017.2695486
Keywords
Controller hardware in loop (CHIL); cosimulation; emulation; hardware in loop (HIL); hardware test-bed (HTB) clusters; laboratory test benches; microgrids (MGs); power hardware in loop (PHIL); real-time (RT) simulation
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Microgrids (MGs) are seen today as the solution to the challenge of meeting the ever-increasing demand of energy which is clean. A variety of challenges need to be overcome for these MGs to be successful varying from stability, power quality to protection, and management. Since the various control strategies are actively being researched and emerging challenges still being addressed, there has been a lot of interest related to the aspect of testing. The ever-increasing complexity of control mechanisms invokes the need for safer, faster yet reliable testing methods, which do not compromise on the degree of detail and at the same time are economical and require the minimum testing time. Off-line simulation, real-time (RT) simulation, hardware in the loop simulation, RT emulation, hardware test beds, pilot plants, and other integrated approaches are the major methods for testing in MGs. This paper gives an overview of the testing techniques and discusses the trends in the various technologies employed for testing MGs. First, the various methods are briefly discussed and a comparison is provided. Next, the various research efforts carried out on the aspect of MG testing are categorized and presented one-by-one. Furthermore, new methodologies and emerging approaches for the testing have also been highlighted, and the challenges and future research avenues have been presented.
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