Journal
APPLIED SCIENCES-BASEL
Volume 7, Issue 6, Pages -Publisher
MDPI AG
DOI: 10.3390/app7060584
Keywords
XFEL; spectroscopy; ultra-shot pulse
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Funding
- JSPS KAKENHI [15H05434, 23226004]
- Japan Synchrotron Radiation Research Institute (JASRI) [2015A8009, 2015B8005, 2015B8013]
- Grants-in-Aid for Scientific Research [15H05434] Funding Source: KAKEN
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We developed a single-shot X-ray spectrometer for wide-range high-resolution measurements of Self-Amplified Spontaneous Emission (SASE) X-ray Free Electron Laser (XFEL) pulses. The spectrometer consists of a multi-layer elliptical mirror for producing a large divergence of 22 mrad around 9070 eV and a silicon (553) analyzer crystal. We achieved a wide energy range of 55 eV with a fine spectral resolution of 80 meV, which enabled the observation of a whole SASE-XFEL spectrum with fully-resolved spike structures. We found that a SASE-XFEL pulse has around 60 longitudinal modes with a pulse duration of 7.7 +/- 1.1 fs.
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