Journal
16TH INTERNATIONAL CONFERENCE ON X-RAY ABSORPTION FINE STRUCTURE (XAFS16)
Volume 712, Issue -, Pages -Publisher
IOP PUBLISHING LTD
DOI: 10.1088/1742-6596/712/1/012018
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The emission spectrometer at Balder/MAX IV beamline is presented. Its unique features are described. Comparison is given with other types of curved crystals analyzers.
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