Journal
ACS APPLIED MATERIALS & INTERFACES
Volume 7, Issue 5, Pages 3117-3125Publisher
AMER CHEMICAL SOC
DOI: 10.1021/am5072628
Keywords
organic light-emitting diodes; degradation; device stability; hole injection interface
Funding
- display research center program of Samsung Display Co., Ltd.
- National Research Foundation of Korea (NRF) - Korea government (MSIP) [NRF-2013R1A2A2A01068753]
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Although the luminous efficiency has been significantly improved in multilayered organic light-emitting diodes (OLEDs), understanding the major factors that influence degradation of OLEDs remains a major challenge due to their complex device structure. In this regard, we elucidate the crucial role of hole injection layer (HIL) in degradation of OLEDs by using systematically controlled hole injection interfaces. To analyze charge injection dependent degradation mechanism of OLEDs, we fabricate multilayered small-molecule OLEDs with molecularly controlled HILs. Although a reduced hole injection energy barrier greatly improves both a luminous efficiency and an operational lifetime (>10 times) of the OLEDs at the same time, large hole injection energy barrier increasingly aggravates its charge injection and transport during device operation. By using various kinds of nondestructive analyses at gradual stages of degradation, we demonstrate that accumulated charges at interfaces due to inefficient charge injection accelerates rate of device degradation.
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