Journal
CERAMICS INTERNATIONAL
Volume 43, Issue 1, Pages 1129-1134Publisher
ELSEVIER SCI LTD
DOI: 10.1016/j.ceramint.2016.10.053
Keywords
Mn-Mg-Zn ferrites; Oxalate precursors; X-ray diffraction; Electrical transport; Dielectric properties
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Funding
- University Grants Commission (UGC), Government of India [F.30-26/2014 (BSR)]
- BCUD Savitribai Phule Pune University [RG-31]
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Here we have investigated the effect of Mn2+ substitution on the structural, electrical transport and dielectric properties of Mg-Zn ferrite having chemical formula MnxMg0.5-xZn0.5Fe2O4 (0.005 <= x <= 0.30) synthesized by an oxalate precursor chemical method. X-ray diffraction study reveals the formation of single cubic structure with spinel lattice symmetry without secondary phases having the crystallite size in the range from similar to 25.35-30.36 nm. The Mn2+ substitution leads to the expansion of spinel lattice unit cell of Mg-Zn ferrite system as evidenced from the increase of lattice constant (a) with respect to Mn2+ content. Decrease in the d.c. electrical resistivity as a function of temperature confirms the semiconducting nature of the Mn2+ substituted Mg-Zn ferrite; which is attributed to the Verwey hopping mechanism between Fe2+ double left right arrow Fe3+ ions and Mn2+ double left right arrow Mn3+ The frequency (100 Hz-1 MHz) dependence dielectric properties viz. dielectric constant and dielectric loss measurement shows the usual dielectric dispersion in accordance with the Maxwell-Wagner type interfacial polarization. The a.c. resistivity measurement (100 Hz-1 MHz) suggests the small polaron hopping type conduction is present in the Mn2+ substituted Mg-Zn ferrite system.
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