Journal
IEEE JOURNAL OF PHOTOVOLTAICS
Volume 7, Issue 1, Pages 32-36Publisher
IEEE-INST ELECTRICAL ELECTRONICS ENGINEERS INC
DOI: 10.1109/JPHOTOV.2016.2615680
Keywords
Diffusion length; light beam induced current (LBIC); liquid phase crystallization; silicon photovoltaics
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We develop a method to quantify the local minority carrier diffusion lengths in interdigitated back-contact solar cells having a 10-mu m-thick liquid-phase crystallized (LPC) Si absorber by light-beam induced current (LBIC) measurements. The method is verified by 2-D simulations of the LBIC signals using ASPIN3. The effective minority carrier diffusion lengths determined this way range between 33 and 44 mu m inside a grain, which proves that advanced cell concepts like an interdigitated back contact (IBC) system are well suited for the LPC absorbers. Furthermore, the method has the potential to help improve the optimization of contact system geometries, and it may be used to understand the influences of different grain orientations and improve the LPC-Si absorber fabrication process.
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