Journal
ACS APPLIED MATERIALS & INTERFACES
Volume 9, Issue 4, Pages 3581-3589Publisher
AMER CHEMICAL SOC
DOI: 10.1021/acsami.6b11892
Keywords
chalcopyrite thin-film solar cells; alkali postdeposition treatment; photoelectron spectroscopy; X-ray spectroscopy; chemical surface structure
Funding
- Helmholtz Association [VH-NG-423]
- Robert Bosch Stiftung GmbH [32.5.8003.0111.0]
- European Union's Horizon research and innovation Programme [641004]
- Swiss State Secretariat for Education, Research, and Innovation (SERI) [REF-1131-52107]
- Office of Science, Office of Basic Energy Sciences, of the U.S. Department of Energy [DE-AC02-05CH11231]
Ask authors/readers for more resources
A NaF/KF postdeposition treatment (PDT) has recently been employed to achieve new record efficiencies of Cu(In,Ga)Se-2 (CIGSe) thin film solar cells. We have used a combination of depth-dependent soft and hard X-ray photoelectron spectroscopy as well as soft X-ray absorption and emission spectroscopy to gain detailed insight into the chemical structure of the CIGSe surface and how it is changed by different PDTs. Alkali-free CIGSe, NaF-PDT CIGSe, and NaF/KF-PDT CIGSe absorbers grown by low-temperature coevaporation have been interrogated. We find that the alkali-free and NaF-PDT CIGSe surfaces both display the well-known Cu-poor CIGSe chemical surface structure. The NaF/KF-PDT, however, leads to the formation of bilayer structure in which a K-In-Se species covers the CIGSe compound that in composition structure of the alkali-free and NaF-PDT absorber. is identical to the chalcopyrite structure of the alkali-free and NaF-PDT absorber.
Authors
I am an author on this paper
Click your name to claim this paper and add it to your profile.
Reviews
Recommended
No Data Available