Journal
APL PHOTONICS
Volume 2, Issue 1, Pages -Publisher
AMER INST PHYSICS
DOI: 10.1063/1.4967802
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Funding
- Universita di Pisa [PRA_2015_0080]
- European Union [604391]
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Analytical formulas are derived describing the coherent absorption of light from a realistic multilayer structure composed by an optically conducting surface on a supporting substrate. The model predicts two fundamental results. First, the absorption regime named coherent perfect transparency theoretically can always be reached. Second, the optical conductance of the surface can be extrapolated from absorption experimental data even when the substrate thickness is unknown. The theoretical predictions are experimentally verified by analyzing a multilayer graphene structure grown on a silicon carbide substrate. The graphene thickness estimated through the coherent absorption technique resulted in good agreement with the values obtained by two other spectroscopic techniques. Thanks to the high spatial resolution that can be reached and high sensitivity to the probed structure thickness, coherent absorption spectroscopy represents an accurate and non-destructive diagnostic method for the spatial mapping of the optical properties of two-dimensional materials and of metasurfaces on a wafer scale. (C) 2016 Author(s). All article content, except where otherwise noted, is licensed under a Creative Commons Attribution (CC BY) license (http://creativecommons.org/licenses/by/4.0/).
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