Journal
SILICON
Volume 9, Issue 3, Pages 347-354Publisher
SPRINGER
DOI: 10.1007/s12633-016-9498-5
Keywords
Silicophosphate glass; Nd2O3; CBH; Dielectric properties
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Silicophosphate glasses of nominal composition (P2O5 50%-SiO2 30%-Na2O 20%) and Nd2O3 additive (0.5 and 2 wt%) were prepared and dielectric behavior has been studied over a temperature range (302-483 K) in the frequency range (0.5 - 3243 kHz). Frequency dependence of AC conductivity (sigma (ac)), has been explored using the universal power law. Disparity of the frequency exponent (s) with temperature was examined in terms of diverse conduction mechanisms. The principal conduction mechanisms were found correlated to both barrier hopping (CBH) and quantum mechanical tunneling (QMT) models. Temperature dependence of sigma (ac) (omega) showed a linear increase with different frequencies. In addition, the capacitance, loss tangent, dielectric loss and dielectric constant were calculated over variable temperature ranges and frequencies.
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