Journal
PHYSICAL REVIEW B
Volume 95, Issue 11, Pages -Publisher
AMER PHYSICAL SOC
DOI: 10.1103/PhysRevB.95.115302
Keywords
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Funding
- ImPACT Program of the Council for Science, Technology and Innovation (Cabinet Office, Government of Japan)
- Japan Society for the Promotion of Science (JSPS) [25246020, 16H02333]
- Ministry of Education, Culture, Sports, Science and Technology (MEXT) [26103003]
- Grants-in-Aid for Scientific Research [14J03484, 26103003] Funding Source: KAKEN
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We experimentally study temperature-dependent spin relaxation including lateral spin diffusion in heavily doped n-type silicon (n+-Si) layers by measuring nonlocal magnetoresistance in small-sized CoFe/MgO/Si lateral spin-valve (LSV) devices. Even at room temperature, we observe large spin signals, 50-fold the magnitude of those in previous works on n+-Si. By measuring spin signals in LSVs with various center-to-center distances between contacts, we reliably evaluate the temperature-dependent spin diffusion length (lambda(Si)) and spin lifetime (tau(Si)). We find that the temperature dependence of tSi is affected by that of the diffusion constant in the n+-Si layers, meaning that it is important to understand the temperature dependence of the channel mobility. A possible origin of the temperature dependence of tSi is discussed in terms of the recent theories by Dery and co-workers.
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