4.8 Article

Complementary Metal Oxide Semiconductor-Compatible, High-Mobility, ⟨111⟩-Oriented GaSb Nanowires Enabled by Vapor-Solid-Solid Chemical Vapor Deposition

Journal

ACS NANO
Volume 11, Issue 4, Pages 4237-4246

Publisher

AMER CHEMICAL SOC
DOI: 10.1021/acsnano.7b01217

Keywords

GaSb nanowires; growth orientation; high mobility; vapor-solid-solid; interface plane orientation; in-plane lattice mismatch

Funding

  1. program of Shandong University, the General Research Fund [CityU 11204614]
  2. Theme-based Research Scheme of the Research Grants Council of Hong Kong SAR, China [T42-103/16-N]
  3. National Natural Science Foundation of China [11404162, 51672229, 61504151]
  4. State Key Laboratory of Multiphase Complex Systems [MPCS-2015-A-04]
  5. Science Technology and Innovation Committee of Shenzhen Municipality [JCYJ20160229165240684]
  6. PAPD
  7. Natural Science Foundations of Jiangsu Province [BK20130549]

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Using CMOS-compatible Pd catalysts, we demonstrated the formation of high-mobility < 111 >-oriented GaSb nanowires (NWs) via vapor solid solid (VSS) growth by surfactant-assisted chemical vapor deposition through a complementary experimental and theoretical approach. In contrast to NWs formed by the conventional vapor liquid solid (VLS) mechanism, cylindrical-shaped Pd5Ga4 catalytic seeds were present in our Pd-catalyzed VSS-NWs. As solid catalysts, stoichiometric Pd5Ga4 was found to have the lowest crystal surface energy and thus giving rise to a minimal surface diffusion as well as an optimal in-plane interface orientation at the seed/NW interface for efficient epitaxial NW nucleation. These VSS characteristics led to the growth of slender NWs with diameters down to 26.9 +/- 3.5 nm. Over 95% high crystalline quality NWs were grown in < 111 > orientation for a wide diameter range of between 10 and 70 nm. Back-gated field-effect transistors (FETs) fabricated using the Pd-catalyzed GaSb NWs exhibit a superior peak hole mobility of, similar to 330 cm(2) V-1 close to the mobility limit for a NW channel diameter of similar to 30 nm with a free carrier concentration of similar to 10(18) cm(-3). This suggests that the NWs have excellent homogeneity in phase purity, growth orientation, surface morphology and electrical characteristics. Contact printing process was also used to fabricate large-scale assembly of Pd-catalyzed GaSb NW parallel arrays, confirming the potential constructions and applications of these high-performance electronic devices.

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