Journal
AIP ADVANCES
Volume 7, Issue 5, Pages -Publisher
AMER INST PHYSICS
DOI: 10.1063/1.4975051
Keywords
-
Ask authors/readers for more resources
Zinc ferrite thin films of varying thickness were deposited at ambient temperature using RF-magnetron sputtering. The films were annealed at temperatures in the range 250 degrees C to 650 degrees C in air for 2 hrs. The magnetization of the film was observed to depend on the average grain size and also on thickness of the film. It was found that thermal annealing reduces the peak to peak ferromagnetic resonance (FMR) line width. A low in-plane line width of 195 Oe and a line width of 170 Oe in perpendicular configuration was observed for a 240 nm thickness film annealed at T-A=450 degrees C. (C) 2017 Author(s). All article content, except where otherwise noted, is licensed under a Creative Commons Attribution (CC BY) license (http://creativecommons.org/licenses/by/4.0/).
Authors
I am an author on this paper
Click your name to claim this paper and add it to your profile.
Reviews
Recommended
No Data Available