4.4 Article

The influence of the in-plane lattice constant on the superconducting transition temperature of FeSe0.7Te0.3 thin films

Journal

AIP ADVANCES
Volume 7, Issue 6, Pages -

Publisher

AMER INST PHYSICS
DOI: 10.1063/1.4989566

Keywords

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Funding

  1. National Science Foundation of China [NSFC-U1432135, 11674054, 11611140101]
  2. Open Partnership Joint Projects of JSPS Bilateral Joint Research Projects [2716G8251b]
  3. JSPS [16H04646]
  4. DFG [GRK1621, GR 4667/1-1]
  5. Open Access Fund of the Leibniz Association
  6. Grants-in-Aid for Scientific Research [16J05432, 16H04646] Funding Source: KAKEN

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Epitaxial Fe(Se, Te) thin films were prepared by pulsed laser deposition on (La0.18Sr0.82)(Al0.59Ta0.41) O-3 (LSAT), CaF2-buffered LSAT and bare CaF2 substrates, which exhibit an almost identical in-plane lattice parameter. The composition of all Fe(Se, Te) films were determined to be FeSe0.7Te0.3 by energy dispersive X-ray spectroscopy, irrespective of the substrate. Albeit the lattice parameters of all templates have comparable values, the in-plane lattice parameter of the FeSe0.7Te0.3 films varies significantly. We found that the superconducting transition temperature (T-c) of FeSe0.7Te0.3 thin films is strongly correlated with their a-axis lattice parameter. The highest Tc of over 19 K was observed for the film on bare CaF2 substrate, which is related to unexpectedly large in-plane compressive strain originating mostly from the thermal expansion mismatch between the FeSe0.7Te0.3 film and the substrate. (C) 2017 Author(s).

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