Journal
PHYSICAL REVIEW B
Volume 95, Issue 20, Pages -Publisher
AMER PHYSICAL SOC
DOI: 10.1103/PhysRevB.95.201409
Keywords
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Funding
- US Department of Energy (DOE), Office of Science (OS), Office of Basic Energy Sciences, Division of Materials Science and Engineering [DE-FG02-07ER46383]
- US Department of Energy [DE-AC02-06CH11357]
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Synchrotron x-ray studies of single-layer TiSe2 reveal displacements of the Ti and Se atoms as a function of temperature. The measurements, with a high sensitivity of 0.001 angstrom, show a (2 x 2) charge-density-wave (CDW) structure at temperatures below a critical temperature of T-C1 = 233 K. The temperature dependence follows a BCS-like second-order mean-field behavior. A five-layer TiSe2 film also exhibits a CDW transition of the same character but at a lower transition temperature of T-C5 = 204 K, which is the same as that for bulk TiSe2. The results demonstrate that lattice distortion is an integral part of the CDW transition that must also involve renormalization of the electronic structure.
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