Journal
ACS NANO
Volume 11, Issue 6, Pages 6312-6318Publisher
AMER CHEMICAL SOC
DOI: 10.1021/acsnano.7b02629
Keywords
halide perovskites; microplatelets; light-emitting diodes; ion migration; laser; single crystal
Categories
Funding
- Air Force Office of Scientific Research [FA9550-16-1-0124]
- National Science Foundation [ECCS-1609032]
- China Scholarship Council (CSC) [201508320105]
- Directorate For Engineering
- Div Of Electrical, Commun & Cyber Sys [1609032] Funding Source: National Science Foundation
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Ion migration has been commonly observed as a detrimental phenomenon in organometal halide perovskite semiconductors, causing the measurement hysteresis in solar cells and ultrashort operation lifetimes in light-emitting diodes. In this work, ion migration is utilized for the formation of a p-i-n junction at ambient temperature in single-crystalline organometal halide perovskites. The junction is subsequently stabilized by quenching the ionic movement at a low temperature. Such a strategy of manipulating the ion migration has led to efficient single-crystalline light-emitting diodes that emit 2:3 eV photons starting at 1.8 V and sustain a continuous operation for 54 h at similar to 5000 cd m(-2) without degradation of brightness. In addition, a whispering-gallery-mode cavity and exciton-exciton interaction in the perovskite microplatelets have both been observed that can be potentially useful for achieving electrically driven laser diodes based on single-crystalline organometal halide perovskite semiconductors.
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