4.6 Article

Strong near band edge emission of (Ce, Yb) co-doped ZnO thin films after high temperature annealing

Journal

OPTICAL MATERIALS EXPRESS
Volume 7, Issue 8, Pages 3041-3050

Publisher

OPTICAL SOC AMER
DOI: 10.1364/OME.7.003041

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Funding

  1. Doctoral Fund of Ministry of Education of China [20111101120021]
  2. State Key Laboratory for Artificial Microstructure and Mesoscopic Physics, Peking University
  3. State Key Laboratory of Nuclear Physics and Technology, Peking University

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We studied the photoluminescence (PL) properties of (Ce + Yb) co-doped ZnO thin films as a function of high temperature annealing. The films were fabricated by magnetron sputtering. After 1000-1100 degrees C annealing, the near band edge (NBE) emissions of the films were dozens to a hundred times stronger than that of undoped ZnO, while the Yb3+ emission (similar to 980 nm) was quite weak, indicating that energy transfers from the ZnO host to Yb3+ ions in the films were not efficient. X-ray diffraction analysis and scanning electron microscopy observations demonstrated that the (Ce + Yb) co-doping had a large effect on the morphology and crystallinity of the films. The crystallinity enhancement of the films is considered to be the main reason for the strong NBE enhancements of the co-doped ZnO films. (C) 2017 Optical Society of America

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