4.6 Article

Enhanced resistive memory in Nb-doped BaTiO3 ferroelectric diodes

Journal

APPLIED PHYSICS LETTERS
Volume 111, Issue 3, Pages -

Publisher

AMER INST PHYSICS
DOI: 10.1063/1.4993938

Keywords

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Funding

  1. National Natural Science Foundation of China [11574169, 51472131, 11504193]
  2. Hong Kong Scholars Program [XJ2015024]
  3. innovation project of Qingdao [17-1-1-71-jch]

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In this study, we report on enhanced resistive memory in BaTiO3-based ferroelectric diodes due to the doping of donors. A large ON/OFF current ratio of similar to 2000, about two orders of magnitude higher than that of Au/BaTiO3/SrRuO3, is achieved in a Au/Nb:BaTiO3/SrRuO3 diode at room temperature. This can be ascribed to the enhanced ferroelectric-modulation on the potential barrier at the Nb: BaTiO3/SrRuO3 interface associated with the (Nb-Ti4+(5+)) donors, which gives rise to an efficient control of device transport between a bulk-limited current in the ON state and an interface-limited Schottky emission in the OFF state. In contrast, the resistance switching is suppressed in a Au/Fe:BaTiO3/SrRuO3 device since the (Fe-Ti4+(3+))' acceptors suppress semiconducting character of the BaTiO3 thin film and make the polarization-modulation of the band diagram negligible. The present work facilitates the design of high-performance resistive memory devices based on ferroelectric diodes with controllable charged defects. Published by AIP Publishing.

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