Journal
IEEE COMPUTER ARCHITECTURE LETTERS
Volume 16, Issue 2, Pages 107-110Publisher
IEEE COMPUTER SOC
DOI: 10.1109/LCA.2017.2675883
Keywords
Phase change memory; main memory; write disturbance; reliability; page remapping; energy saving
Categories
Funding
- US NSF CCF [1617071]
- IIT, Hyderabad, India
- Division of Computing and Communication Foundations
- Direct For Computer & Info Scie & Enginr [1617071, 1422331] Funding Source: National Science Foundation
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At small feature sizes, phase change memory (PCM) shows write disturbance (WD) error (WDE) and this issue can eclipse the density and energy efficiency advantage of PCM. We propose 'Decongest', a technique to address WD errors in main memory designed with super-dense (4F(2) cell size) PCM. Decongest works by identifying and remapping write-intensive hot pages to a WD-free spare area, which avoids WD to nearby pages due to writing these hot pages, and WD to these hot pages from writing nearby pages. Compared to a WD-affected super-dense PCM baseline, Decongest improves the performance by 14.0 percent, and saves 21.8 percent energy.
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