Journal
APPLIED PHYSICS LETTERS
Volume 111, Issue 1, Pages -Publisher
AMER INST PHYSICS
DOI: 10.1063/1.4991358
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Funding
- laboratory directed research and development funds at the Oak Ridge National Laboratory
- U.S. Department of Energy [DE-AC05-00OR22725]
- CNRS
- Aix-Marseille Universite
- region PACA
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In photonics, the field concentration and enhancement have been major objectives for achieving size reduction and device integration. Plasmonics offers resonant field confinement and enhancement, but ultra-sharp optical resonances in all-dielectric multi-layer thin films are emerging as a powerful contestant. Thus, applications capitalizing upon stronger and sharper optical resonances and larger field enhancements could be faced with a choice for the superior platform. Here, we present a comparison between plasmonic and dielectric multi-layer thin films for their resonance merits. We show that the remarkable characteristics of the resonance behavior of optimized dielectric multi-layers can outweigh those of their metallic counterpart. Published by AIP Publishing.
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