4.6 Article

Optimized sensitivity of silicon-on-insulator (SOI) strip waveguide resonator sensor

Journal

BIOMEDICAL OPTICS EXPRESS
Volume 8, Issue 2, Pages 500-511

Publisher

OPTICAL SOC AMER
DOI: 10.1364/BOE.8.000500

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Funding

  1. Natural Sciences and Engineering Research Council of Canada (NSERC)
  2. Directorate For Engineering
  3. Div Of Chem, Bioeng, Env, & Transp Sys [1264174] Funding Source: National Science Foundation

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Evanescent field sensors have shown promise for biological sensing applications. In particular, Silicon-on-Insulator (SOI)-nano-photonic based resonator sensors have many advantages for lab-on-chip diagnostics, including high sensitivity for molecular detection and compatibility with CMOS foundries for high volume manufacturing. We have investigated the optimum design parameters within the fabrication constraints of Multi-Project Wafer (MPW) foundries that result in the highest sensitivity for a resonator sensor. We have demonstrated the optimum waveguide thickness needed to achieve the maximum bulk sensitivity with SOI-based resonator sensors to be 165 nm using the quasi-TM guided mode. The closest thickness offered by MPW foundry services is 150 nm. Therefore, resonators with 150 nm thick silicon waveguides were fabricated resulting in sensitivities as high as 270 nm/RIU, whereas a similar resonator sensor with a 220 nm thick waveguide demonstrated sensitivities of approximately 200 nm/RIU. (C) 2017 Optical Society of America

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