Journal
APPLIED PHYSICS LETTERS
Volume 111, Issue 3, Pages -Publisher
AMER INST PHYSICS
DOI: 10.1063/1.4995456
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Funding
- National Science Foundation [ECCS-1607250]
- International Postdoctoral Exchange Fellowship Program [20160007]
- Div Of Electrical, Commun & Cyber Sys
- Directorate For Engineering [1607250] Funding Source: National Science Foundation
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We demonstrate a refractive index (RI) sensor based on semiconductor nanowire lasers. It is shown that the TE01 mode is responsible for lasing and sensing with the lasing threshold of 3 mu J/mm(2) and the lasing peak width as narrow as 0.22 nm. A RI sensitivity of 21.2 nm/RIU (refractive index units), a figure of merit of approximately 100, and an RI detection limit of 1.4 x 10(-3) RIU are achieved. Published by AIP Publishing.
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