4.8 Article

Silicon single-photon avalanche diodes with nano-structured light trapping

Journal

NATURE COMMUNICATIONS
Volume 8, Issue -, Pages -

Publisher

NATURE PUBLISHING GROUP
DOI: 10.1038/s41467-017-00733-y

Keywords

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Funding

  1. National Fundamental Research Program [2013CB336800]
  2. Chinese Academy of Science
  3. National Natural Science Foundation of China
  4. National Science Foundation as part of the National Nanotechnology Coordinated Infrastructure [ECCS-1542152]
  5. DARPA DETECT program
  6. NSF [ECCS-1641006]
  7. National Fundamental Research Program [2013CB336800]
  8. Chinese Academy of Science
  9. National Natural Science Foundation of China
  10. National Science Foundation as part of the National Nanotechnology Coordinated Infrastructure [ECCS-1542152]
  11. DARPA DETECT program
  12. NSF [ECCS-1641006]

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Silicon single-photon avalanche detectors are becoming increasingly significant in research and in practical applications due to their high signal-to-noise ratio, complementary metal oxide semiconductor compatibility, room temperature operation, and cost-effectiveness. However, there is a trade-off in current silicon single-photon avalanche detectors, especially in the near infrared regime. Thick-junction devices have decent photon detection efficiency but poor timing jitter, while thin-junction devices have good timing jitter but poor efficiency. Here, we demonstrate a light-trapping, thin-junction Si single-photon avalanche diode that breaks this trade- off, by diffracting the incident photons into the horizontal waveguide mode, thus significantly increasing the absorption length. The photon detection efficiency has a 2.5-fold improvement in the near infrared regime, while the timing jitter remains 25 ps. The result provides a practical and complementary metal oxide semiconductor compatible method to improve the performance of single-photon avalanche detectors, image sensor arrays, and silicon photomultipliers over a broad spectral range.

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