4.6 Article

Role of defects in enhanced Fermi level pinning at interfaces between metals and transition metal dichalcogenides

Journal

PHYSICAL REVIEW B
Volume 96, Issue 20, Pages -

Publisher

AMER PHYSICAL SOC
DOI: 10.1103/PhysRevB.96.205303

Keywords

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Funding

  1. National Natural Science Foundation of China [11674310, 61622406, 61571415, 51502283]
  2. National Key Research and Development Program of China [2016YFB0700700]
  3. Hundred Talents Program of Chinese Academy of Sciences (CAS)
  4. CAS/SAFEA International Partnership Program for Creative Research Teams

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Density functional theory calculations are performed to explore the nature of the contact between metal electrodes and defected monolayer MoSe2. Partial Fermi level pinning is observed at perfect MoSe2/metal interfaces. Both As-and Br-substituted MoSe2 will induce extra bands in valence band and conduction band, respectively, which exerts influence on the Schottky barrier height. An enhanced partial Fermi level pinning occurs when As- and Br-substituted MoSe2 make contacts with metal electrodes. Se vacancy in the MoSe2 layer can induce a large amount of interfacial states in the band gap of the MoSe2 layer. As a result, nearly complete Fermi level pinning is observed in Se-vacancy MoSe2/metal contacts. Our work offers insight into the Fermi level pinning at the interfaces between two-dimensional materials and metal electrodes, which is important for the applications of two-dimensional materials in nanoelectronic devices with good performance.

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