Microstructure variations induced by excess PbX2 or AX within perovskite thin films

We systematically investigated the impact of stoichiometric ratio variation between PbX2 and AX on hybrid perovskite films from the perspective of microstructure, especially on the plane stacking directions, using the two-dimensional synchrotron radiation grazing incidence wide-angle X-ray scattering (GIWAXS) technique. The tuned crystal plane stacking in perovskite films can consequently enlighten further explorations about the relationship between microstructure and solar cell performance.