Journal
SOFT COMPUTING
Volume 22, Issue 13, Pages 4197-4203Publisher
SPRINGER
DOI: 10.1007/s00500-017-2709-1
Keywords
Automatic thresholding; Nondestructive testing; Defect detection; Entropy
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Funding
- Basic Science Research Program through the National Research Foundation of Korea (NRF) - Ministry of Education [2015R1D1A1A01057518]
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Defect detection is one of the most important tasks and a challenging problem for industrial quality control. Among the available visual inspection techniques, automatic thresholding is a commonly used approach for defect detection because of the simplicity in terms of its implementation and computing. In this paper, we propose an automatic thresholding technique, which is an improvement in Otsu's method, using an entropy weighting scheme. The proposed method enables the detection of extremely small defect regions compared to the product surface area. Experimental results confirm the efficiency of the proposed system over other techniques.
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