Journal
X-RAY MICROSCOPY CONFERENCE 2016 (XRM 2016)
Volume 849, Issue -, Pages -Publisher
IOP PUBLISHING LTD
DOI: 10.1088/1742-6596/849/1/012043
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At the Advanced Light Source (ALS), Beamline 8.3.2 performs hard X-ray micro tomography under conditions of high temperature, pressure, mechanical loading, and other realistic conditions using environmental test cells. With scan times of 10s-100s of seconds, the microstructural evolution of materials can be directly observed over multiple time steps spanning prescribed changes in the sample environment. This capability enables in-situ quasi static mechanical testing of materials. We present an overview of our in-situ mechanical testing capabilities and recent hardware developments that enable flexural testing at high temperature and in combination with acoustic emission analysis.
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