Journal
MATERIALS TODAY ENERGY
Volume 7, Issue -, Pages 149-160Publisher
ELSEVIER SCI LTD
DOI: 10.1016/j.mtener.2017.07.014
Keywords
Perovskite; Grain boundary; Defect; Stability; Passivation
Funding
- Air Force Office of Scientific Research (AFOSR) [FA9550-15-1-0610, FA9550-15-1-0333]
- Office of Naval Research (ONR) [N00014-04-1-0434]
- National Science Foundation (NSF) [DMR-1210893, ECCS-EPMD-1509955]
- Directorate For Engineering [1509955] Funding Source: National Science Foundation
- Div Of Electrical, Commun & Cyber Sys [1509955] Funding Source: National Science Foundation
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With a certified power conversion efficiency (PCE) exceeding 22%, the hunt is now on clues to further improve the PCE and stability of perovskite (PVSK) solar cells toward commercialization. Polycrystalline PVSK films are grown by low temperature solution processes that results in the formation of sub-micron scale grains and consequent grain boundaries. The large discrepancy observed between optoelectronic properties of the polycrystalline films and single crystals of PVSK implies that grain boundaries may largely influence the optoelectronic properties of the PVSK thin film. In this article, important studies on the roles of the grain boundaries on optoelectronic properties and stability of the PVSK are reviewed. (c) 2017 Elsevier Ltd. All rights reserved.
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