Journal
SOLID EARTH SCIENCES
Volume 3, Issue 1, Pages 16-29Publisher
ELSEVIER SCIENCE BV
DOI: 10.1016/j.sesci.2017.12.002
Keywords
XRD; Quantitative analysis; Clay minerals; RIR and MIF methods; Rietveld and full pattern summation methods
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Funding
- National Natural Science Foundation of China [41472044, 41272059, 41173069]
- National Basic Research Program of China [2012CB214704-01]
- Natural Science Foundation of Guangdong Province [2014A030313682]
- Science and Technology Program of Guangzhou, China [201510010153]
- GIGCAS [IS-2486]
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The quantification of clay minerals is essential for the evaluation of clay-rich rock and soil, but it remains challenging due to the unique structures and various element compositions of clay minerals. In this article, several quantification methods for clay minerals sourced from X-ray diffraction (XRD) analysis, mainly recommending the reference intensity ratio (RIR), mineral intensity factor (MIF), Rietveld, and full pattern summation methods are reviewed. Principles and applications of these methods are focused upon in addition to related differences in the analysis of clay minerals (i.e., sample preparation, the selection of characteristic reflections for quantification and standards added during analysis). This critical review also provides a proposal for selection of an adaptive XRD quantification method to be applied to various clay-rich samples. Copyright (c) 2018, Guangzhou Institute of Geochemistry. Production and hosting by Elsevier B.V. This is an open access article under the CC BY-NC-ND license.
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