Journal
PROCEEDINGS OF THE NATIONAL ACADEMY OF SCIENCES OF THE UNITED STATES OF AMERICA
Volume 115, Issue 3, Pages 483-488Publisher
NATL ACAD SCIENCES
DOI: 10.1073/pnas.1711994115
Keywords
fatigue; shear band; X-ray microdiffraction; damage mechanism; strain gradient
Categories
Funding
- National Natural Science Foundation of China [51231002, 51471032, 51527801]
- Fundamental Research Funds for the Central Universities [06111020, FRF-TP-14-047A1]
- State Key Laboratory for Advanced Metals and Materials [2014Z-01]
- China Postdoctoral Science Foundation [2014M560884]
- US Department of Energy, Office of Science, Office of Basic Energy Science [DE-AC02-06CH11357]
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Shear banding is a ubiquitous phenomenon of severe plastic deformation, and damage accumulation in shear bands often results in the catastrophic failure of a material. Despite extensive studies, the microscopic mechanisms of strain localization and deformation damage in shear bands remain elusive due to their spatial-temporal complexities embedded in bulk materials. Here we conducted synchrotron-based X-ray microdiffraction (mu XRD) experiments to map out the 3D lattice strain field with a submicron resolution around fatigue shear bands in a stainless steel. Both in situ and postmortem mu XRD results revealed large lattice strain gradients at intersections of the primary and secondary shear bands. Such strain gradients resulted in severe mechanical heterogeneities across the fatigue shear bands, leading to reduced fatigue limits in the high-cycle regime. The ability to spatially quantify the localized strain gradients with submicron resolution through mu XRD opens opportunities for understanding the microscopic mechanisms of damage and failure in bulk materials.
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