Journal
9TH BRAZILIAN CONGRESS ON METROLOGY (METROLOGIA 2017)
Volume 975, Issue -, Pages -Publisher
IOP PUBLISHING LTD
DOI: 10.1088/1742-6596/975/1/012037
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Radiographic film exposure is traditionally measured by the transmittance of a beam of light through the film. There are many mathematical and computational models to characterize the curve behaviour and its properties, but almost none of them considers the limitations caused by the equipment used. As long as exposure in film increases, light intensity measured after the film decreases in a way that from a certain exposure, light couldn't be distinguished from any kind of noise. This work aims to propose x-ray fluorescence as a solution for better measure high exposed films and show how it could be modelled mathematically.
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