Journal
OPTICAL MATERIALS
Volume 72, Issue -, Pages 122-129Publisher
ELSEVIER SCIENCE BV
DOI: 10.1016/j.optmat.2017.05.052
Keywords
Thin film; Quinolinone; Structural properties; Optical properties
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Thin films of 4-cyanopyranoquinolinedione, CPQ with different thicknesses were deposited by thermal evaporation method. The structural properties of powder and thin films were investigated using X-ray diffraction technique. The crystal structure, lattice parameters and Miller indices of the powder were indexed. The crystalline size, strain and dislocation density were determined for powder and thin films. The optical properties of CPQ thin films were studied using spectrophotometric measurements of both transmittance and reflectance in the wavelength range 200-2500 nm. HOMO-LUMO band gap was determined by cyclic voltammetry. The calculation of optical band gap using absorption coefficient showed that the film has direct allowed transition with 3.02 eV energy gap. The normal dispersion of the refractive index of the films was described by Wemple DiDomenico single oscillator model. Some dispersion parameters were calculated. Also, the real and imaginary parts of dielectric constant, volume and surface energy loss functions were estimated. (C) 2017 Elsevier B.V. All rights reserved.
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